ME 574: Nano/Micro Structure Evolution
Winter 2010 Term Project
Taka Matsuura: tmatsuur@umich.edu
Michael Tran: miketran@umich.edu
Chris Welch: welchc@umich.edu
Instructor: Professor Wei Lu
ME 574 Course Website
Abstract
The purpose of this study is to apply current thin film surface migration and diffusion methods to more complex configurations. Using careful manipulation of the finite element matrices, the single layer, single boundary simulation methods given to us were adapted to create simulations of the evolution of both multi-boundary and multi-layer systems. We successfully simulated several of these configurations. The results we found show that having multiple boundaries or layers in the system can strongly affect how each individual grain boundary evolves. Videos and more detailed discussions of these simulations can be found in the results and conclusions pages.