Abstract
The objective of this project is to simulate the change in surface morphology of Au thin film at different annealing temperatures. Here we have employed the finite element approach to model the surface morphology change due to the interface diffusion and migration that we have learned in the class. Temperature dependent variables are used to observe the surface morphology change at different temperatures. For the quantification of roughness change, the root mean square (RMS) and groove depth are calculated. Two different geometries (with/without grain boundary) are considered in our simulation. The results show that the surface roughness of the model with grain boundary increases with increasing temperature. Without the grain boundary, the surface roughness decreases with the increase of temperature.
Gold-tin thin film deposited on the light emitting diodes
Insturctor: Professor Wei Lu
Project Group 4
Dong Hoon Song
Hosop Shin
Yoon Koo Lee
